A Toyohashi University of Technology-led team reported a laboratory method that measures soft-X-ray absorption at multiple water-layer thicknesses, then uses multivariate curve resolution to distinguish interfacial water from bulk water. The Oct. 29 university-supplied report describes tests on silicon-nitride surface oxide and model lipid bilayers; the underlying paper appeared online Oct. 1. This is a spectroscopy-method result, not a coating or medical-device product.
GLOBAL IMAGING BRIEF
Analysis: Isolating weak interfacial spectra could help materials researchers compare water-solid and water-membrane interactions. Whether the technique works on other materials, under different conditions or outside a synchrotron remains to be tested.
Original source
Original source: Toyohashi University of Technology material distributed via Phys.org on Oct. 29; Applied Physics Express paper, DOI 10.35848/1882-0786/aea737, online Oct. 1. No commercial performance claim is made.