An international research team from Germany, Switzerland and Japan has demonstrated that a single reflection zone plate (RZP) can perform both soft X-ray imaging and resonant inelastic X-ray scattering (RIXS) mapping. The approach simplifies future instruments by allowing simultaneous determination of structural location and electronic property variations in materials.
GLOBAL IMAGING BRIEF
Analysis: Consolidating imaging and spectroscopy functions into a single optical element reduces instrument complexity and cost, potentially accelerating adoption of advanced RIXS techniques in materials science and industrial inspection.
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