Tokyo Electron Reports Ramp in Combined Optical-Electrical PIC Testing

In its Oct. 30 FY2027 Q2 investor presentation, Tokyo Electron said volume production is ramping for integrated optical and electrical testing of photonic integrated circuits (PICs) within its prober business. The slide gives no PIC-specific shipment count, customer name, yield result or throughput figure. Its separate forecast for leading-edge logic probers should not be applied to PIC test equipment.

GLOBAL IMAGING BRIEF

Why it matters

Analysis: Integrating optical coupling and electrical probing is a meaningful manufacturing-test direction for PICs. Buyers should request alignment repeatability, insertion-loss calibration and per-die test-time data before comparing platforms.

Original source

Original source: Tokyo Electron's Oct. 30 FY2027 Q2 presentation, slide 15. The ramp is a company statement, not a disclosed PIC shipment metric.